کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1617885 | 1005696 | 2010 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Comparative study of electrical properties of Cd and Te-enriched CdTe thin films at cryogenic temperature
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فلزات و آلیاژها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Comparative study of electrical properties of Cd and Te-enriched CdTe thin films at cryogenic temperature Comparative study of electrical properties of Cd and Te-enriched CdTe thin films at cryogenic temperature](/preview/png/1617885.png)
چکیده انگلیسی
Cd and Te-enriched cadmium telluride (CdTe) polycrystalline thin films were grown on corning glass substrates by Close Spaced Sublimation (CSS) technique. The structural investigations performed by means of X-ray diffraction (XRD) technique, scanning electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDX) showed that the deposited films exhibit a polycrystalline structure with ã1Â 1Â 1ã as preferred orientation. The optical transmittance for Te-enriched CdTe sample was above 0.8 in the range of 1500-2500Â nm, which was significantly below 0.8 for Cd-enriched CdTe sample. The electrical properties of these samples were analyzed as a function of the Cd and Te concentration at cryogenic temperature. The electrical resistivity dropped several orders of magnitude. These properties are significantly changed at cryogenic temperature. The comparative study revealed that using this deposition technique, n-type, and p-type Cd and Te-enriched CdTe polycrystalline films can be produced.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 506, Issue 2, 17 September 2010, Pages 661-665
Journal: Journal of Alloys and Compounds - Volume 506, Issue 2, 17 September 2010, Pages 661-665
نویسندگان
Nazar Abbas Shah,