Composition dependent of dielectric properties in Se100−xSnx glassy alloys

▶ The study of dielectric relaxation in some amorphous material is expected to reveal structural information which, in effect, can be useful for the understanding of the conduction mechanism as well. ▶ In this paper, the temperature and frequency dependence of the dielectric constants and the dielectric losses in Se100−xSnx glassy systems in the frequency range (1 kHz-5 MHz) and temperature range (300 K-350 K) have been measured which are found to be highly dependent on frequency and temperature. ▶ The change of the dielectric parameters with Sn in a-Se could be explained on the basis of the electro-negativity difference and the nature of covalent character of bonds between the constituent elements used in making the above glassy alloys.