Fabrication and characterization of a Ni–Mn–Ga uniaxially textured freestanding film deposited by DC magnetron sputtering

Homogeneous freestanding films have been obtained by the direct current (DC) magnetron sputtering technique using a sacrificial layer. After annealing, the films are crystallized with a strong out-of-plane texture along the (0 2 2) direction. The stoichiometry of the annealed films is close to the target composition and leads to a martensitic transformation around 255 K. The annealed films demonstrate ferromagnetic behavior with a Curie temperature of about 362 K. The magnetization process has been studied on the both states and during the martensitic transition. The saturation magnetizations have been determined by fitting the experimental data with a saturation approach law in the range of 1–5 T. Results show the saturation magnetization of the martensite is around 10% higher than that of the austenite. A model based on intrinsic magnetic properties of each state allowing the description of the magnetization M = f(H, T) of such polycrystalline films during the martensitic transformation is presented. The mass fraction of martensite inside the austenite phase can be determined using this model. The shape memory effect is analyzed both by scanning electron microscopy and by optical microscopy with in situ measurement of the resistance temperature dependence.