کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1621935 1516399 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Investigations of the properties of Zn1−xCrxO thin films grown by RF magnetron sputtering
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فلزات و آلیاژها
پیش نمایش صفحه اول مقاله
Investigations of the properties of Zn1−xCrxO thin films grown by RF magnetron sputtering
چکیده انگلیسی
This work investigated the properties of Cr doped ZnO (Zn1−xCrxO) thin films with different doping concentrations (x = 0.05, 0.15, 0.30) on a Si (1 0 0) substrate using RF magnetron sputtering. These films have been characterized by powder X-ray diffraction (XRD), atomic force microscopy (AFM) and vibrating sample magnetometer (VSM) measurements to investigate structural, morphological and magnetic properties. XRD results reveal that the wurtzite structure deviates for the films with higher concentrations of Cr. The VSM measurements show the ferromagnetic behaviour for all the Cr doped ZnO films at room temperature.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 478, Issues 1–2, 10 June 2009, Pages 45-48
نویسندگان
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