کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1624223 1516416 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
SrBi2(Ta0.5Nb0.5)2O9SrBi2(Ta0.5Nb0.5)2O9:W thin films obtained by chemical solution deposition: Morphological and ferroelectric characteristics
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فلزات و آلیاژها
پیش نمایش صفحه اول مقاله
SrBi2(Ta0.5Nb0.5)2O9SrBi2(Ta0.5Nb0.5)2O9:W thin films obtained by chemical solution deposition: Morphological and ferroelectric characteristics
چکیده انگلیسی

The effect of tungsten (W6+) ion substituting on dielectric and ferroelectric behavior in SrBi2(Ta0.5Nb0.5)2O9 (SBTN) thin films prepared by polymeric precursor method was investigated at room temperature. The addition of W6+ ion in the SBTN lattice was evaluated by X-ray diffraction (XRD), microstructural and dielectrical properties. An increase in the grain size is evident when tungsten is introduced in the SBTN lattice. Substitution of tungsten until 10% on B site leads to introduce space charge polarization into the system, resulting in an appreciable decrease in both dielectric constant and tangent loss. The morphology of the thin films investigated by atomic force microscopy leads to an increase in the grain size after tungsten addition. Fatigue resistance was noted with increase in tungsten addition.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 461, Issues 1–2, 11 August 2008, Pages 326–330
نویسندگان
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