Effect of annealing time on morphological characteristics of Ba(Zr,Ti)O3 thin films

Ba(Zr0.50 Ti0.50)O3 thin films were prepared by the polymeric precursor method using the annealing low temperature of 300 °° C for 8, 16, 24, 48, 96 and 192 h in a furnace tube with oxygen atmosphere. The X-ray diffraction patterns revealed that the film annealed for 192 h presented some crystallographic planes (1 0 0), (1 1 0) and (2 0 0) in its crystalline lattice. Fourier transformed infrared presented the formation of metal-oxygen stretching at around 756 cm−1. The atomic force microscopy analysis presented the growth of granules in the Ba(Zr0.50 Ti0.50)O3 films annealed from 8 to 96 h. The crystalline film annealed for 192 h already presents grains in its perovskite structure. It evidenced a reduction in the thickness of the thin films with the increase of the annealing time.