کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1645251 1517286 2013 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The optical properties of alumina films prepared by electron beam evaporation at oblique incidence
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
The optical properties of alumina films prepared by electron beam evaporation at oblique incidence
چکیده انگلیسی


• Alumina thin films deposited by EBPVD with the oblique angle deposition (OAD) method.
• The refractive index decreases with the increase of the inclined angle.
• The porosity increases with the increase of the inclined angle.
• The porosity varies with increasing substrate temperature.

The optical properties of alumina thin films deposited by using electron beam evaporation with the oblique angle deposition (OAD) method are reported. The relationships between the refractive index, the porosity, the inclined angles, and substrate temperatures are studied. The results show that the refractive index decreases with the increase of the inclined angle, the porosity increases with the increase of the inclined angle, the porosity decreases with the increase of the substrate temperature when the inclined angle is approximately smaller than 40°, and the porosity increases with the increase of the substrate temperature when the inclined angle is approximately larger than 40°. The morphology is investigated by using scanning electron microscope (SEM). The morphology images illustrate the cause of the porosity varies with the substrate temperature. So the oblique angle deposition method is an effective way to control the microstructure of thin films.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 101, 15 June 2013, Pages 1–4
نویسندگان
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