Synchrotron based reciprocal space mapping and dislocation substructure analysis

During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple dislocation cell/wall model capable of computing numerical reciprocal space maps is presented. The model qualitatively captures the experimentally observed features.