کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1658078 | 1517652 | 2013 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effect of shot peening on the residual stress and microstructure of duplex stainless steel
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Effect of shot peening on the residual stress and microstructure of duplex stainless steel Effect of shot peening on the residual stress and microstructure of duplex stainless steel](/preview/png/1658078.png)
چکیده انگلیسی
The effect of shot peening (SP) treatment on duplex stainless steel S32205 is studied in order to improve the material surface properties. Residual stress distributions in both ferrite and austenite are investigated by X-ray diffraction, and microstructure is explored using Rietveld method. The results reveal that different distributions of compressive residual stress between ferrite and austenite under the same SP condition are resulted from the diverse hardness for different phases in duplex stainless steel. After SP, domain sizes in both ferrite and austenite are refined, and microstrain, dislocation densities and compound fault probabilities are observed to increase sharply in the near surface layer. It is found that distribution trends of residual stresses along the variation of depths are similar to those of lattice parameters for both phases. It can be obtained that in the near-top surface layers, the SP influence on residual stresses and microstructure of austenite is stronger than those of ferrite under the same SP condition. These results reveal that SP treatment with proper processing is efficient for the improvement of the surface properties of duplex stainless S32205.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 226, 15 July 2013, Pages 140-144
Journal: Surface and Coatings Technology - Volume 226, 15 July 2013, Pages 140-144
نویسندگان
Qiang Feng, Chuanhai Jiang, Zhou Xu, Lechun Xie, Vincent Ji,