کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1660014 1517691 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The effects of the post annealing temperatures of (Pb0.92La0.08)(Zr0.65Ti0.35)O3 (PLZT) thin films on ITO coated glass
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
The effects of the post annealing temperatures of (Pb0.92La0.08)(Zr0.65Ti0.35)O3 (PLZT) thin films on ITO coated glass
چکیده انگلیسی

Lanthanum modified lead zirconate titanate thin films were fabricated on indium-doped tin oxide (ITO)-coated glass substrate by R.F. magnetron sputtering method. The thin films were deposited at 500 °C and annealed at various temperatures (550 ~ 750 °C) by rapid thermal processing. The structure and the morphology of the films were measured by an X-ray diffraction and an atomic force microscope. The hysteresis loops and the fatigue properties of thin films were measured by a precision material analyzer. As the annealing temperature increased, the remnant polarization value increased whereas the coercive field was reduced. In our switching polarization endurance analysis, the remnant polarization of PLZT thin films annealed at 750 °C decreased after 109 switching cycles in the form of square waves.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 203, Issues 5–7, 25 December 2008, Pages 638–642
نویسندگان
, , , , ,