کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1660947 1517692 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Nanostructure characterization in single and multi layer yttria stabilized zirconia films using XPS, SEM, EDS and AFM
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Nanostructure characterization in single and multi layer yttria stabilized zirconia films using XPS, SEM, EDS and AFM
چکیده انگلیسی
Single and multiple layers of yttria partially stabilized zirconia (6Y-TZP) nanostructured films were deposited on 304 stainless steel substrate by an electrochemical deposition method. This technique is considered to be an important tool in the formation of nanostructured materials, including monolayer and multilayer films, powders and composites. The aim of the work reported in this paper is the codeposition of two hydroxides, Zr(OH)4 and Y(OH)3, in order to obtain yttria partially stabilized ziconia film, and the preparation of monolayer and multilayer ceramic film of 6Y-TZP. To examine the structure and composition of one layer and three layers of 6Y-TZP deposited on 304 stainless steel, several experimental techniques were used: XPS, XRD, SEM, TEM, EDS and AFM. The XPS technique revealed that zirconia and yttria were present in solid solution. This result was corroborated by XRD. SEM and TEM showed that nanostructured uniform and homogeneous films were obtained. AFM results verified that no deep cracks reached the substrate surface and that little roughness was present on the films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 203, Issues 3–4, 25 November 2008, Pages 211-216
نویسندگان
, , , ,