کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1662648 | 1008446 | 2007 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
An alternative micro-area X-ray diffraction method for residual stress measurement of Pb(Zr,Ti)O3 film
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: An alternative micro-area X-ray diffraction method for residual stress measurement of Pb(Zr,Ti)O3 film An alternative micro-area X-ray diffraction method for residual stress measurement of Pb(Zr,Ti)O3 film](/preview/png/1662648.png)
چکیده انگلیسی
An alternative X-ray diffraction method for micro-area residual stress measurement was proposed by means of the analysis of a single diffraction ring, which was performed on a laboratory X-ray microdiffraction system equipped with a 2D planar detector. The microdiffraction experiments were employed to evaluate the residual stress in sol–gel-derived Pb(Zr,Ti)O3 film before and after Ag electrode deposition. The tensile stresses of about 2.3 GPa and 1.2 GPa were calculated in the micro-area of film without and with electrode, which was related to a top electrode stress relaxation effect.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 202, Issue 1, 15 November 2007, Pages 121–125
Journal: Surface and Coatings Technology - Volume 202, Issue 1, 15 November 2007, Pages 121–125
نویسندگان
F. Yang, W.D. Fei, Z.M. Gao, J.Q. Jiang,