Rapid Measurement of Nanoparticle Thickness Profiles

► A method is developed to convert ADF-STEM images to 'thickness profile' images. ► It is applicable in particles survey, facets determination and discrete tomography. ► A method to calibrate the response of the ADF detector is described. ► The response in analysed across a range of conditions. ► Dynamical ADF image simulations are presented, demonstrating intensity vs. thickness dependence.