Calibration of reconstruction parameters in atom probe tomography using a single crystallographic orientation

► Quantitative approach is developed to accurately reconstruct APT data. ► Curvature of atomic planes in APT data is used to calibrate the reconstruction. ► APT reconstruction parameters are determined from a single crystallographic axis. ► Quantitative approach is demonstrated on W, Al and Al-Mg-Sc systems. ► Accurate APT reconstruction of complex materials is now possible.