Nanoscale quantitative phase imaging using XOR-based X-ray differential interference contrast microscopy

► Proposed a quantitative x-ray phase imaging method using XOR-based DIC microscopy. ► Implemented bias retardation by shifting the grating with respect to the zone-plate. ► A nonlinear regression algorithm is used to extract the object's phase distribution. ► Both quantitative phase reconstruction and qualitative DIC imaging are demonstrated.