کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1677790 1009909 2011 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
KSpaceNavigator as a tool for computer-assisted sample tilting in high-resolution imaging, tomography and defect analysis
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
KSpaceNavigator as a tool for computer-assisted sample tilting in high-resolution imaging, tomography and defect analysis
چکیده انگلیسی

This article describes a novel software tool, the KSpaceNavigator, which combines sample stage and crystallographic coordinates in a control sphere. It also provides simulated kinematic diffraction spot patterns, Kikuchi line patterns and a unit cell view in real time, thus allowing intuitive and transparent navigation in reciprocal space. By the overlay of experimental data with the simulations and some interactive alignment algorithms, zone axis orientations of the sample can be accessed quickly and with great ease. The software can be configured to work with any double-tilt or tilt–rotation stage and overcomes nonlinearities in existing goniometers by lookup tables. A subroutine for matching the polyhedral shape of a nanoparticle assists with 3D analysis and modeling. The new possibilities are demonstrated with the case of a faceted BaTiO3 nanoparticle, which is tilted into three low-index zone axes using the piezo-controlled TEAM stage, and with a multiply twinned tetrahedral Ge precipitate in Al, which is tilted into four equivalent zone axes using a conventional double-tilt stage. Applications to other experimental scenarios are also outlined.


► Software system for crystal tilting in tomography and diffraction contrast imaging.
► Intuitive graphical control interface allows navigation in crystal coordinates.
► System applicable to manual or automated double-tilt and tilt–rotation stages.
► Range of applications from fully manual to fully computer-controlled sample stages.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 111, Issue 11, November 2011, Pages 1574–1580
نویسندگان
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