کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1677858 | 1009917 | 2011 | 8 صفحه PDF | دانلود رایگان |
We discuss a new interpretation of mirror electron microscopy (MEM) images, whereby electric field distortions caused by surface topography and/or potential variations are sufficiently large to create caustics in the image contrast. Using a ray-based trajectory method, we consider how a family of rays overlaps to create caustics in the vicinity of the imaging plane of the magnetic objective lens. Such image caustics contain useful information on the surface topography and/or potential, and can be directly related to surface features. Specifically we show how a through-focus series of MEM images can be used to extract the contact angle of a Ga droplet on a GaAs (001) surface.
Research highlights
► We discuss a new interpretation of mirror electron microscopy (MEM) images.
► Mirror microscopy images often contain strong caustic features.
► A family of ray-based electron trajectories overlaps to create caustics.
► Image caustics contain useful information on the surface topography and potential.
► We extract the contact angle of a Ga droplet on a GaAs (001) surface.
Journal: Ultramicroscopy - Volume 111, Issue 5, April 2011, Pages 356–363