Fabrication and electric measurements of nanostructures inside transmission electron microscope

Using manipulation holders specially designed for transmission electron microscope (TEM), nanostructures can be characterized, measured, modified and even fabricated in-situ. In-situ TEM techniques not only enable real-time study of structure–property relationships of materials at atomic scale, but also provide the ability to control and manipulate materials and structures at nanoscale. This review highlights in-situ electric measurements and in-situ fabrication and structure modification using manipulation holder inside TEM.

Research highlights
► We review in-situ works using manipulation holder in TEM.
► In-situ electric measurements, fabrication and structure modification are focused.
► We discuss important issues that should be considered for reliable results.
► In-situ TEM is becoming a very powerful tool for many research fields.