کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1678242 | 1009936 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spin polarization of field-emitted electrons from half-metallic Co2MnSi thin films grown on a W(0 0 1) facet
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We measured spin polarization of electrons field-emitted from half-metallic Co2MnSi thin film grown on a W(0 0 1) facet via chromium buffer layer using Mott scattering. For spontaneously magnetized samples, values of polarization at room temperature were observed in a range from 10% to 46% and the polarization direction was 〈1 1 0〉 orientation of substrate tungsten, which agreed with an easy axis of magnetization of bulky Co2MnSi. An enhancement of polarization was observed as a consequence of applying a magnetic field of 350 G perpendicular to the emitter axis after the annealing at 800 K. This result is considered to be caused by improvement in crystallinity of the evaporated film due to annealing.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 109, Issue 5, April 2009, Pages 395–398
Journal: Ultramicroscopy - Volume 109, Issue 5, April 2009, Pages 395–398
نویسندگان
Shigekazu Nagai, Yuji Fujiwara, Koichi Hata,