کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678750 1009959 2008 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Multivariate statistical approach to electron backscattered diffraction
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Multivariate statistical approach to electron backscattered diffraction
چکیده انگلیسی
This paper assesses the potential of multivariate statistical analysis (MSA) applied to electron backscattered diffraction (EBSD) data. Instead of directly indexing EBSD patterns on an individual basis, this multivariate approach reduces a large (thousands) set of individual EBSD patterns into a core set of statistically derived component EBSD patterns which can be subsequently indexed. The following hypotheses are considered in this paper: (1) experimental EBSD patterns from a microstructure can be analytically treated as linear combinations of spatially simple components, (2) MSA has an angular resolution on par with standard EBSD, (3) MSA can discriminate between similar and dissimilar phases, and (4) the MSA approach can improve the effective spatial resolution of automated EBSD.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 108, Issue 6, May 2008, Pages 567-578
نویسندگان
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