کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678778 1009962 2007 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Imaging using inelastically scattered electrons in CTEM and STEM geometry
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Imaging using inelastically scattered electrons in CTEM and STEM geometry
چکیده انگلیسی

It is shown that energy filtered transmission electron microscopy images are closely related to energy spectroscopic scanning transmission electron microscopy images. For the case of a single atom, we explore this similarity using both the coupled channels and density matrix approaches. We extend the result to the crystal case and find that the similarity persists, the limiting effects due to energy differences in the scattered electrons being small for typical specimen thicknesses in high-resolution transmission electron microscopy.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 108, Issue 1, December 2007, Pages 58–67
نویسندگان
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