کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1686445 | 1518763 | 2006 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electronic stopping of hydrogen ions deduced from TOF-LEIS spectra
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Protons and deuterons with energies 0.33-10Â keV were used to obtain time-of-flight low energy ion scattering (TOF-LEIS) spectra for thin layers of Au evaporated onto a B/Si substrate. The thickness (2.4Â nm) and the root-mean-square roughness (0.5Â nm) of the Au layer were determined by Rutherford Backscattering Spectrometry (RBS) and Atomic Force Microscopy (AFM), respectively. To deduce the electronic stopping power, TRBS simulations were performed with dE/dx as an input parameter that was optimized to fit the experimental spectra. At energies above 3Â keV, the low energy edge in the experimental spectra was widened due to the film roughness. Therefore, the simulations were carried out for the Au layer composed by two different thicknesses in order to yield optimum agreement. The resulting stopping values compare favourably to literature data. No proton/deuteron isotope effect in stopping of hydrogen ions was observed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 249, Issues 1â2, August 2006, Pages 58-61
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 249, Issues 1â2, August 2006, Pages 58-61
نویسندگان
S.P. Chenakin, S.N. Markin, E. Steinbauer, M. Draxler, P. Bauer,