کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1691377 | 1011311 | 2008 | 7 صفحه PDF | دانلود رایگان |
Thin films of copper oxide were deposited by thermal evaporation of cuprous oxide (Cu2O) powder. The substrates were either unheated or heated to a temperature of 300 °C. The films were also annealed in air at a temperature of 500 °C for 3 h. The films were characterized by X-ray photoelectron spectroscopy, X-ray diffraction and UV-visible spectrophotometry. The effects of the substrate temperature and post-deposition annealing on the chemical, structural and optical properties of the films were investigated. As-deposited films on unheated substrates consisted of mixed cupric oxide (CuO) and Cu2O phases, with a higher concentration of the Cu2O phase. However, the films deposited on heated substrates and the annealed films were predominantly of the CuO phase.
Journal: Vacuum - Volume 82, Issue 6, 19 February 2008, Pages 623–629