Component- and system-level degradation modeling of digital Instrumentation and Control systems based on a Multi-State Physics Modeling Approach

The results of the application of the proposed degradation model to a digital I&C system of literature are compared with the results obtained by a Markov Chain Model (MCM). The integrated stochastic-deterministic process here proposed to drive the MC simulation is viable to integrate component-level models into a system-level model that would consider inter-system or/and inter-component dependencies and uncertainties.