کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1789329 | 1023502 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Annealing effect of platinum-based electrodes on physical properties of PZT thin films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Annealing effect of platinum-based electrodes on physical properties of PZT thin films Annealing effect of platinum-based electrodes on physical properties of PZT thin films](/preview/png/1789329.png)
چکیده انگلیسی
This study examined the crystal structure and surface morphology, including the Ti segregation mechanism on the surface due to the inter-diffusion between Pt, Ti and TiOx as a glue layer, according to the annealing temperature and growth orientation of a Pt film. In addition, the fatigue mechanism of ferroelectric PZT thin films deposited on a Pt-based electrode was also investigated. The nano-structure, orientation mapping, and micro-morphologies of the triangular Pt hillocks were investigated by scanning electron microscopy with an electron backscatter diffraction (EBSD) function. The D–E hysteresis loop of the ferroelectric films was measured using a Sawyer–Tower circuit at 1 kHz to obtain the remanent polarization and coercive field.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 9, Issue 1, January 2009, Pages 115–119
Journal: Current Applied Physics - Volume 9, Issue 1, January 2009, Pages 115–119
نویسندگان
Ye-Sul Jeong, Hyun-Uk Lee, Sang-A Lee, Jong-Pil Kim, Hyun-Gyu Kim, Se-Young Jeong, Chae-Ryong Cho,