Fabrication and characterization of textured Bi2Te3 thermoelectric thin films prepared on glass substrates at room temperature using pulsed laser deposition

Thin films of n-type Bi2Te3 were fabricated on glass substrates at room temperature using pulsed laser deposition. Samples were characterized by using X-ray diffraction (XRD), scanning electron microscopy (SEM), Raman spectroscopy, and a physical properties measurement system. The XRD and Raman results show that crystalline films can be easily achieved at room temperature, and all films have a preferred crystal growth texture along the (0 1 5) direction. SEM indicates that the films are high-quality and smooth. The Seebeck coefficient, electrical resistivity, and magnetoresistance were measured over wide ranges of temperature and magnetic field. It was found that Seebeck coefficient of the films was significantly enhanced after annealing process.

► The n-type Bi2Te3 films were fabricated on glass at room temperature with PLD.
► All films have a preferred crystal growth texture along the (0 1 5) direction.
► The films are high-quality and smooth.
► The MR ratio for samples annealed at 573 K was found to be 3.25% at 5 K.
► The thermopower of annealed film is 2.5 times larger than that of the as-grown film.