کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1792014 | 1524475 | 2012 | 4 صفحه PDF | دانلود رایگان |

Fe and Fe3O4 thin films were grown by radio frequency magnetron sputtering. Fe2O3 was used as the target and hydrogen was introduced together with Argon gas to provide a certain reducing atmosphere. By varying H2/Ar flow ratio, the changes in composition and structure of the thin films from (110) Fe to (111) Fe3O4 were observed by X-ray diffraction. The valence states of Fe in the thin films were analyzed by X-ray photoelectron spectroscopy. Magnetization measurements indicate that the Fe thin films grown with low H2/Ar flow ratios possess large coercive force. It was ascribed to the increasing boundary density and the increasing amount of Fe oxides such as FeO distributed at the boundary.
► (110) Fe and (111) Fe3O4 thin films were grown by magnetron sputtering with Fe2O3 target.
► H2 was introduced to provide a reducing ambient.
► The coercive force of Fe thin films increases with the decreasing H2/Ar flux ratio.
Journal: Journal of Crystal Growth - Volume 340, Issue 1, 1 February 2012, Pages 74–77