Comparative study of HgxCd1−xTe films grown on CdTe thin films previously deposited from two different techniques

High quality cadmium telluride (CdTe) thin films were grown on glass substrates with two different techniques, two evaporation source (TES) and closed space sublimation (CSS). Further to the above mercury telluride (HgTe) was then deposited by using single source on both CdTe thin films for obtaining HgxCd1−xTe samples. The crystalline structure of the HgxCd1−xTe sample grown from CSS-CdTe showed the preferential (1 1 1) orientation with smoother and larger grain size than those of TES-CdTe. The optical transmission for TES-CdTe sample was above 90% in the 1000–1500 nm range whereas it was significantly below 80% for CSS-CdTe sample. The optical transmission for TES-HgxCd1−xTe and CSS-HgxCd1−xTe was ∼60%. The resistivity at room temperature of TES-CdTe and CSS-CdTe was ∼3.33×109 Ω cm and ∼2.20×108 Ω cm, respectively, while the resistivity of TES-HgxCd1−xTe and CSS-HgxCd1−xTe samples was ∼1.73 Ω cm and ∼5.34×105 Ω cm, respectively. The comparative study of ternary compound prepared with the above techniques has been carried out for the first time.