کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1794488 | 1023699 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Defects formation of the in situ reaction synthesized TiB whiskers
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Coarse and fine TiB whiskers were formed during the reaction synthesized TiB reinforced Ti matrix composites. The microstructure of the as-synthesized TiB whiskers has been investigated by TEM and HREM. Dislocations and stacking faults were observed in the coarse TiB whiskers, and only high-density stacking faults presented in the fine TiB whiskers. The formation of dislocations is related to the stacking faults, the formation mechanism and atomic structure of dislocations in the in situ synthesized TiB whiskers was suggested.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 311, Issue 6, 1 March 2009, Pages 1612–1615
Journal: Journal of Crystal Growth - Volume 311, Issue 6, 1 March 2009, Pages 1612–1615
نویسندگان
Qingchang Meng, Haibo Feng, Guangchang Chen, Ronghai Yu, Dechang Jia, Yu Zhou,