کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1796708 1023752 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Fabrication of highly oriented lead-free (Na, K)NbO3 thin films at low temperature by Sol–Gel process
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
Fabrication of highly oriented lead-free (Na, K)NbO3 thin films at low temperature by Sol–Gel process
چکیده انگلیسی

Lead-free piezoelectric (Na0.5K0.5)NbO3 (NKN) thin films were fabricated on SiO2/Si substrates by sol–gel process. The NKN precursor solution was prepared from Na-ethoxide, K-ethoxide, Nb-pentaethoxide, and 2-methoxyethanol. From thermogravimetry differential thermal analysis (TG-DTA) curve of the precursor dried-gel, weight loss and exothermic peaks appeared at about 300–500 °C at heating period. By using optimum fabrication conditions established from the TG-DTA, highly oriented single- phase NKN thin films were obtained at 500 °C by spin-coating technique. Average grain size and root mean square roughness obtained from atomic force microscope (AFM) image of the NKN thin film sintered at 500 °C were estimated to be about 250 and 8.35 nm, respectively. From TG curve, crystallinity and surface morphology, it is found that volatilization of alkaline elements seems to have been suppressible at temperature lower than 600 °C.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 294, Issue 2, 4 September 2006, Pages 209–213
نویسندگان
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