Transverse electric (TE) and transverse magnetic (TM) X-ray guided modes in a two-layer crystalline heterostructure: A comparison

Polarization effects upon Bragg-case hard X-ray dynamical diffraction in a two-layer crystalline heterostructure waveguide have been investigated with the help of numerical modeling. A difference is shown to exist in both intensities and excitation conditions between TE (transverse electric) and TM (transverse magnetic) X-ray guided modes that are inherent to the waveguide. A comparison of σ- and π-polarized X-ray reflectivity curves from such a waveguide is performed. Possibilities for the experimental excitation of the TE and TM X-ray guided modes are discussed.