Extraction of important electrical parameters of CuO

Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic activation energies were observed. The applicability of various theoretical models was considered to explain results on electrical transport. We extracted important electrical parameters of CuO, which might be useful for its gas sensor applications.

Research Highlights
► The important electrical parameters of CuO were extracted. Three distinct activation contributions were observed.
► Above 200 K, conductivity was controlled by potential barrier.
► Below 200 K, conductivity was described in terms of hopping conduction.