Specular and off-specular scattering with polarization and polarization analysis on reflectometer V6 at BER II, HZB

We report on the enhanced capabilities of neutron reflectometer V6 at the research reactor BER II at Helmholtz-Zentrum Berlin für Materialien und Energie (HZB) in investigating magnetic thin films and multilayers. It is now fully equipped for simultaneous measurements of specular and off-specular scattering with polarization and polarization analysis. The magnetization configuration of a [CoO/Co/Au]×16 polycrystalline multilayer at room temperature is reported in demonstrating the efficiency of the instrument. The data is simulated within the supermatrix formalism under the distorted wave Born approximation for a quantitative analysis.