Trap state capture and reemission relaxation in ceramic La1−xCaxMnO3 with Ca-content x=0.51

An unusual relaxation type of transport phenomenon occurs in La049 Ca0.51 MnO3 which is connected with electron or hole trap state capture and reemission out of a 65 meV potential well. The phenomenon is observed in ceramic samples only if (1) charge order domains occur with a lateral distance between 3 and 30 nm and if (2) E- and H-field sensitive near boundary metastable states exist.