Magneto-optical Kerr rotation in amorphous TiO2/Co magnetic semiconductor thin films

TiO2/Co thin films were prepared on glass substrates under thermal non-equilibrium condition by alternately sputtering very thin TiO2 and Co layers for 60 periods. Microstructure and composition analyses by X-ray diffraction, transmission electron microscopy, X-ray photoemission spectroscopy and electron energy-loss spectroscopy indicated that the Co element was incorporated into TiO2 to form the Ti1−xCoxO2 magnetic semiconductors. The obvious Kerr rotations in the samples were observed, and the relation between the Kerr rotation and Co concentration was discussed.