Simulated and measured hysteresis curves for thin films

A computer micromagnetic simulator was used to simulate magnetization curves for Permalloy (Ni80Fe20)-based thin films and magnetic multilayers. The results of computer simulations are compared with the magnetic measurements made with a vibrating sample magnetometer and the agreement concerning the shape of the hysteresis loops, coercive field and the ratio between the remanent to saturation magnetization is very good for films with the magnetic layer thinner than 100 nm. The parameters used for simulations are inspired from the film structure.