Microstructure of YBCO thin films prepared by TFA-MOD method

The microstructure of the recently developed coated conductors was investigated by using electron back scatter diffraction pattern (EBSP). We prepared TFA (trifluoroacetates)-MOD (metal organic deposition) derived YBa2Cu3O7−x (YBCO) films on CeO2/LaMnO3/IBAD-MgO/Gd2Zr2O7/Hastelloy C276 substrates of 1 cm-width. The EBSP observation showed that there was a difference of surface microstructure between the midsection and the end of TFA-MOD YBCO film layer in the direction of width. This is attributed not to the local difference of the biaxial texture of CeO2 top layer but to the local difference of growth condition during TFA-MOD process.