کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1819181 1026051 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Interfilamentary coupling properties of Bi2223/Ag tapes with oxide barriers subjected to AC perpendicular magnetic field
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
Interfilamentary coupling properties of Bi2223/Ag tapes with oxide barriers subjected to AC perpendicular magnetic field
چکیده انگلیسی
In this paper, we fabricated Bi2223 tapes with interfilamentary oxide barriers and evaluated interfilamentary coupling properties under an AC perpendicular magnetic field at 77 K. To avoid the side effect on Bi2223 phase formation during sintering process, SrZrO3 was selected for barrier materials. Moreover, 20 wt.% Bi2212 was mixed with SrZrO3 to improve its ductility for cold working. Monocore Ag-sheathed rods were coated by the oxide barriers with slurry before stacking with a honeycomb structure. By twisting the filament with twist pitch length below 10 mm and introducing interfilamentary barriers, the coupling frequency (fc) under an AC perpendicular field, which is inversely proportional to the decay time constant (τc) of coupling current, exceeded 100 Hz. At perpendicular field amplitude above full-penetration field, the magnetization losses of the twisted barrier tape were reduced by 30-40% around power-grid frequency, compared with analytical values for fully-coupled filaments. However, the loss values were still considerably higher than the prediction of the hysteresis loss (Qh) for the completely decoupled filaments. From the frequency dependence of losses, it was suggested that the loss reduction of twisted barrier tape around power-grid frequency were limited by not only the contribution of coupling current loss (Qc) but also the insufficient Qh reduction due to the presence of physical connection among the filaments positioned near the center of a tape section.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica C: Superconductivity - Volume 470, Issue 1, 1 January 2010, Pages 20-24
نویسندگان
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