The influence of the rhenium in the precursor film on the properties of the thin superconducting films based on thallium

Thin films of thallium based superconductors have been prepared on a CeO2 buffered R-plane sapphire as well as on a LaAlO3 substrate using an RF magnetron sputtering and an ex situ thallination in a one zone configuration. We have studied the influence of the presence of the rhenium in the precursor film on structural and electrical properties of the final films. Our results show that the presence of the rhenium in the precursor films caused the significant changes in the morphology of the prepared films.