Effect of La2Zr2O7-buffered YSZ substrate on YBa2Cu3Oy thin films by chemical solution deposition

Epitaxial YBa2Cu3Oy (YBCO) thin films have been fabricated by chemical solution deposition (CSD) on La2Zr2O7-buffered YSZ single crystal substrate, where the buffer layer has three kinds of morphology – flat surface, rough surface and pore surface. The effect of LZO buffer layer’s roughness on the YBCO films was evaluated by X-ray diffraction, scanning electron microscopy and temperature-dependent resistivity measurements. The flat surface of LZO layer is beneficial to highly epitaxial YBCO films and high critical current density.