کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1819567 | 1525766 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Estimation of critical current density and grain connectivity in superconducting MgB2 bulk using Campbell's method
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Many recent reports on the critical current density (Jc) in superconducting MgB2 bulks indicated that improving the grain connectivity is important, since the obtained Jc values were generally much lower than those in other metallic superconductors and it was ascribed to the poor connectivity between grains in polycrystalline MgB2. In this study, we focused on the estimation of the global critical current density, super-current path, grain connectivity and their relationships with the faults volume fraction in the MgB2 bulks prepared by a modified PIT (powder in tube) method. Campbell's method was applied for the purpose of obtaining the penetrating AC flux profile and the characteristic of AC magnetic field vs. penetration depth from the sample's surface. A computer simulation on the penetrating AC flux profile in MgB2 bulks with randomly distributed voids, oxidized grains and other faults was also carried out. Jc obtained by Campbell's method turned out to be smaller than that obtained from the SQUID measurement, implying that the global super-current was reduced by the existence of various faults and the lack of the electrical connectivity. It was verified that the relationship between the global critical current characteristics and the faults contained in MgB2 samples can be quantitatively clarified by comparing the simulated critical current densities and other factors with the experimental results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica C: Superconductivity - Volume 468, Issues 15â20, 15 September 2008, Pages 1443-1446
Journal: Physica C: Superconductivity - Volume 468, Issues 15â20, 15 September 2008, Pages 1443-1446
نویسندگان
B. Ni, Y. Morita, Z. Liu, C. Liu, K. Himeki, E.S. Otabe, M. Kiuchi, T. Matsushita,