کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1820322 | 1525783 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Film thickness dependence of critical current characteristics of YBCO-coated conductors
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Film thickness dependence of critical current characteristics of YBCO-coated conductors Film thickness dependence of critical current characteristics of YBCO-coated conductors](/preview/png/1820322.png)
چکیده انگلیسی
The dependence of superconducting layer thickness on the critical current characteristics was investigated in the range of 0.5–1.5 μm for YBCO-coated conductors made by the PLD process. Since the dimension of the pinning is considered to be three as indicated by the pinning correlation length, it is concluded that the observed thickness dependence of the critical current density at low fields come simply from a degradation in the superconducting layer structure with increasing thickness. The irreversibility field and the n-value increase with the thickness. These dependencies are well described by the theoretical model of the flux creep and flow.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica C: Superconductivity and its Applications - Volumes 445–448, 1 October 2006, Pages 141–145
Journal: Physica C: Superconductivity and its Applications - Volumes 445–448, 1 October 2006, Pages 141–145
نویسندگان
K. Kimura, M. Kiuchi, E.S. Otabe, T. Matsushita, S. Miyata, A. Ibi, T. Muroga, Y. Yamada, Y. Shiohara,