I–V Characteristic and Josephson inductance of ultra-long intrinsic Josephson junction arrays

Long intrinsic Josephson junction arrays (3.4 mm) were successfully fabricated in misaligned Tl2Ba2CaCu2O8 thin films grown on 20° vicinal substrates. The array consists of about 7.7 × 105 intrinsic Josephson junctions. The I–V characteristic was recorded and compared with that of a 6 μm long array. The inductance of the ultra-long junction array in zero-voltage state was observed and measured directly. The measured value is basically consistent with the theoretically calculated result, confirming that the inductance is mainly due to the Josephson effect. The inductance from the Josephson effect is one order of magnitude larger than that from other effects, suggesting a new idea of the use of intrinsic Josephson junction arrays as new type of inductors with small size and large inductance.