Simulations and Measurements of Secondary Electron Emission Beam Loss Monitors for LHC

Secondary Emission Monitor (SEM) is a part of the LHC Beam Loss Monitoring system, which is providing the number of particles lost from the primary hadron beam by measuring the radiation field induced by their interaction with matter surrounding the beam pipe. SEM detectors will be used in the high dose rate environments of LHC because of their low sensitivity and excellent linearity. The design of SEM consists of two bias electrodes separating the produced secondary electrons from the Ti signal electrode placed in a vacuum steel cylinder. The response of the chamber was tested with bunched and continuous proton beams and compared with a reference detector and GEANT4 simulations.