X-ray scattering from liquid interfaces

Synchrotron radiation X-ray scattering is a useful tool for structural characterization of liquid interfaces. Specular reflectivity provides precise measurement of the interfacial widths and of the ordering of surfactants adsorbed to these interfaces. Diffuse scattering gives information on phase transitions and domain formation in surfactant monolayers and on interfacial fluctuations confined by and coupled across fluidic films.