Mass spectrometry investigation of the degradation of polyethylene terephtalate induced by low-energy (<100 eV) electrons

Polyethylene terephtalate (PET) thin films were damaged by low-energy (0–100 eV) electron irradiation to simulate the degradation of this polymer in electronic devices. The products formed were analyzed by mass spectrometry. The emission of anions from the polymer surface is associated with dissociative electron attachment (DEA) and dipolar dissociation (DD) for H−, and with DD for O−. The monotonic emission rise in O− desorption as a function of incident electron energy is produced by mid-chain C–O–C cleavage, leading to chain scission. The signal of the positive mass fragments showed only a monotonic increase with electron energy. In this case, chemical recombination with hydrogen atoms also leads to chain scission.