کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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272097 | 505011 | 2012 | 6 صفحه PDF | دانلود رایگان |

Tritium exposure experiments were carried out for three kinds of EAST SiC coated doped-graphite (SiC/C) samples, one from the original graphite tiles without being irradiated, and the other two from erosion and deposition areas of first wall after the 2009 campaign in EAST. β-ray-induced X-ray spectrometry (BIXS) was used to characterize the exposed samples. It is showed that the significant amount of tritium was absorbed in the surface of deposition sample in comparison with that of original sample, which was also supported by the results of imaging plate (IP) measurements. In addition, it was found that drastic decrease in tritium retention appeared by lowering exposure temperature, and the trapped tritium was maintained stably with time. Computer simulation is used to analyze the details of depth profile of tritium in different kinds of samples.
Journal: Fusion Engineering and Design - Volume 87, Issues 7–8, August 2012, Pages 1399–1404