کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4458094 | 1312656 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Computer-controlled scanning electron microscopy: A fast and reliable tool for diamond prospecting
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موضوعات مرتبط
مهندسی و علوم پایه
علوم زمین و سیارات
زمین شناسی اقتصادی
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چکیده انگلیسی
Computer-controlled scanning electron microscopy is introduced as a faster, reliably and cost-reducing alternative to conventional electron microprobe analyses on kimberlite indicator minerals. The method is based on conventional scanning electron microscopy and energy dispersive X-ray spectrometry, but due to extended counting times, optimised settings and computer-controlled particle recognition valid data can be obtained on a low amount of operator and machine time. A comparison of the results between both methods yields that computer-controlled scanning electron microscopy is able to investigate major and minor element concentrations in indicator minerals with almost the same precision as the electron microprobe.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Geochemical Exploration - Volume 103, Issue 1, October 2009, Pages 1–5
Journal: Journal of Geochemical Exploration - Volume 103, Issue 1, October 2009, Pages 1–5
نویسندگان
Nynke Keulen, Mark T. Hutchison, Dirk Frei,