کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
4458094 1312656 2009 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Computer-controlled scanning electron microscopy: A fast and reliable tool for diamond prospecting
موضوعات مرتبط
مهندسی و علوم پایه علوم زمین و سیارات زمین شناسی اقتصادی
پیش نمایش صفحه اول مقاله
Computer-controlled scanning electron microscopy: A fast and reliable tool for diamond prospecting
چکیده انگلیسی

Computer-controlled scanning electron microscopy is introduced as a faster, reliably and cost-reducing alternative to conventional electron microprobe analyses on kimberlite indicator minerals. The method is based on conventional scanning electron microscopy and energy dispersive X-ray spectrometry, but due to extended counting times, optimised settings and computer-controlled particle recognition valid data can be obtained on a low amount of operator and machine time. A comparison of the results between both methods yields that computer-controlled scanning electron microscopy is able to investigate major and minor element concentrations in indicator minerals with almost the same precision as the electron microprobe.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Geochemical Exploration - Volume 103, Issue 1, October 2009, Pages 1–5
نویسندگان
, , ,