کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4958777 | 1364834 | 2016 | 14 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Interval Simulated Annealing applied to Electrical Impedance Tomography image reconstruction with fast objective function evaluation
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
علوم کامپیوتر (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The Electrical Impedance Tomography (EIT) reconstruction problem can be solved as an optimization problem in which the discrepancy between a simulated impedance domain and the observed one is minimized. This optimization problem can be solved by a combination of Simulated Annealing (SA) for optimization and the Finite Element Method (FEM) for simulating the impedance domain. A new objective function based on the total least squares error minimization is proposed. This objective function is ill-conditioned with dense meshes. Two possibilities to overcome ill-conditioning are considered: combination with another objective function (Euclidean distance) and inclusion of a regularization term. To speed up the algorithm, results from previous iterations are used to improve the present iteration convergence, and a preconditioner is proposed. This new reconstruction approach is evaluated with experimental data and compared with previous approaches.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Computers & Mathematics with Applications - Volume 72, Issue 5, September 2016, Pages 1230-1243
Journal: Computers & Mathematics with Applications - Volume 72, Issue 5, September 2016, Pages 1230-1243
نویسندگان
Thiago de Castro Martins, Marcos de Sales Guerra Tsuzuki, Erick Dario León Bueno de Camargo, Raul Gonzalez Lima, Fernando Silva de Moura, Marcelo Brito Passos Amato,