Formation of stacking fault and dislocation behavior during the high-temperature annealing of single-crystal HPHT diamond

Formation of stacking fault and dislocation behavior during the high-temperature annealing of single-crystal HPHT diamond

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Diamond and Related Materials - Volume 75, May 2017, Pages 155-160

Satoshi Masuya, Kenji Hanada, Takayoshi Oshima, Hitoshi Sumiya, Makoto Kasu,